μc-Si thin film transistors with very thin active layer
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0038-1101 |
| Author | Samb, Mamadou Lamine, Jacques, Emmanuel, Belarbi, Khaled, Coulon, Nathalie, ., Mohammed-Brahim, Tayeb |
| Maintainer | CCSD |
| Last Updated | May 8, 2026, 05:23 (UTC) |
| Created | May 8, 2026, 05:23 (UTC) |
| Identifier | hal-00905339 |
| Language | en |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| creator | Samb, Mamadou Lamine |
| date | 2013-11-08T00:00:00 |
| harvest_object_id | 430bac70-adbe-4887-8f21-9087ca547377 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-12-08T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2013.07.001 |
| set_spec | type:ART |