Industry-Wide Technology Road Mapping in Double Unknown - The Case of the Semiconductor Industry
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE International Technology Management Conference |
| Author | Cogez, Patrick, Kokshagina, Olga, Le Masson, Pascal, Weil, Benoit |
| Maintainer | CCSD |
| Last Updated | May 8, 2026, 05:48 (UTC) |
| Created | May 8, 2026, 05:48 (UTC) |
| Identifier | hal-00903874 |
| Language | en |
| contributor | STMicroelectronics [Crolles] (ST-CROLLES) |
| coverage | The Hague, Netherlands |
| creator | Cogez, Patrick |
| date | 2013-06-24T00:00:00 |
| harvest_object_id | 36a3cb95-dc8b-4260-9ace-fdd704ba22bd |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-09T00:00:00 |
| set_spec | type:COMM |