Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9499 |
| Author | El Moukhtari, Issam, Pouget, Vincent, Darracq, Frédéric, Larue, Camille, Perdu, Philippe, Lewis, D. |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 03:16 (UTC) |
| Created | May 9, 2026, 03:16 (UTC) |
| Identifier | hal-00880480 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | El Moukhtari, Issam |
| date | 2013-05-09T00:00:00 |
| harvest_object_id | e5b78fa3-d290-4237-87c4-f98532ccbc0f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2012.2231437 |
| set_spec | type:ART |