Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0026-2714 |
| Author | El Moukhtari, Issam, Pouget, Vincent, Larue, Camille, Darracq, Frédéric, Lewis, D., Perdu, Philippe |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 03:16 (UTC) |
| Created | May 9, 2026, 03:16 (UTC) |
| Identifier | hal-00880459 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | El Moukhtari, Issam |
| date | 2013-11-09T00:00:00 |
| harvest_object_id | b020d050-c5cc-4365-8b4b-167ef76a58f6 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2013.07.129 |
| set_spec | type:ART |