Evaluating a low cost robustness improvement in SRAM-based FPGAs

ISBN : 978-1-4799-0662-8

Data and Resources

Additional Info

Field Value
Source Proceedings of 18th IEEE International On-Line Testing symposium (IOLTS'13)
Author Ben Jrad, M., Leveugle, Régis
Maintainer CCSD
Last Updated May 9, 2026, 09:21 (UTC)
Created May 9, 2026, 09:21 (UTC)
Identifier hal-00872826
Language en
contributor Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)
coverage Chania, Crete, France
creator Ben Jrad, M.
date 2013-07-08T00:00:00
harvest_object_id 80b88f64-f66b-4e94-ae5d-fdffdbb9474b
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-26T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/IOLTS.2013.6604072
set_spec type:COMM