Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
| Author | Dutertre, Jean-Max, Possamai Bastos, Rodrigo, Potin, Olivier, Flottes, Marie-Lise, Rouzeyre, Bruno, Di Natale, Giorgio |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 09:26 (UTC) |
| Created | May 9, 2026, 09:26 (UTC) |
| Identifier | hal-00872705 |
| Language | en |
| contributor | Département Systèmes et Architectures Sécurisés (SAS-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC |
| coverage | Arcachon, France |
| creator | Dutertre, Jean-Max |
| date | 2013-09-30T00:00:00 |
| harvest_object_id | f6735106-ad59-4296-8fed-b736846d4a34 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |