Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) |
| Author | Possamai Bastos, Rodrigo, Sicard, G., Kastensmidt, Fernanda, Lima, Renaudin, Marc, Reis, Ricardo |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 13:21 (UTC) |
| Created | May 9, 2026, 13:21 (UTC) |
| Identifier | hal-00867836 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Monte Cassino Abbey and Gaeta, Italy |
| creator | Possamai Bastos, Rodrigo |
| date | 2010-10-11T00:00:00 |
| harvest_object_id | cf454ed0-2ba1-4ef7-9f7e-717d6b984b0d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |