XPS study of the band alignment at ITO/oxide (n-type MoO3 or p-type NiO) interface
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1862-6300 |
| Author | C. Bernede, J., Houari, S., Nguyen, D., Jouan, Pierre-Yves, Khelil, A., Mokrani, A., Cattin, Linda, Predeep, P. |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 14:31 (UTC) |
| Created | May 9, 2026, 14:31 (UTC) |
| Identifier | hal-00866418 |
| Language | en |
| contributor | Institut des Matériaux Jean Rouxel (IMN) ; Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST) ; Université de Nantes (UN)-Université de Nantes (UN)-Ecole Polytechnique de l'Université de Nantes (EPUN) ; Université de Nantes (UN)-Université de Nantes (UN)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS) |
| creator | C. Bernede, J. |
| date | 2012-05-09T00:00:00 |
| harvest_object_id | 00a2cb8b-8af4-4c25-bb6d-7690e75e96f3 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-09-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1002/pssa.201127428 |
| set_spec | type:ART |