Investigation of Electromagnetic Fault Injection Effects on Embedded Cryptosystems
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of First Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2013) |
| Author | Alberto, D., Maistri, Paolo, Leveugle, Régis |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 17:24 (UTC) |
| Created | May 9, 2026, 17:24 (UTC) |
| Identifier | hal-00862773 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Avignon, France |
| creator | Alberto, D. |
| date | 2013-05-30T00:00:00 |
| harvest_object_id | c6761dc6-9b52-4e32-bbdc-483da639145a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |