An efficient BER-Based Reliability Method For SRAM-based FPGA
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 7th IEEE International Design and Test Symposium IDT'2012 |
| Author | Sahraoui, Fouad, Ghaffari, Fakhreddine, Benkhelifa, Mohamed El Amine, Granado, Bertrand |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 00:03 (UTC) |
| Created | May 10, 2026, 00:03 (UTC) |
| Identifier | hal-00854818 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | ASTRE [Cergy-Pontoise] ; Equipes Traitement de l'Information et Systèmes (ETIS - UMR 8051) ; Ecole Nationale Supérieure de l'Electronique et de ses Applications (ENSEA)-Centre National de la Recherche Scientifique (CNRS)-CY Cergy Paris Université (CY)-Ecole Nationale Supérieure de l'Electronique et de ses Applications (ENSEA)-Centre National de la Recherche Scientifique (CNRS)-CY Cergy Paris Université (CY) |
| coverage | Doha, Qatar |
| creator | Sahraoui, Fouad |
| date | 2012-12-15T00:00:00 |
| harvest_object_id | 6e81621a-0723-4b5b-9b0f-382346544f2d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-08T00:00:00 |
| set_spec | type:COMM |