Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0304-3991 |
| Author | Britton, T.B., Maurice, Claire, Fortunier, Roland, Driver, Julian Haworth, Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., Wilkinson, A.J. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 00:35 (UTC) |
| Created | May 10, 2026, 00:35 (UTC) |
| Identifier | hal-00854176 |
| Language | en |
| contributor | Department of Materials, University of Oxford; ; Department of Materials ; University of Oxford-University of Oxford |
| creator | Britton, T.B. |
| date | 2010-11-02T00:00:00 |
| harvest_object_id | 036ccff6-13ba-4c1a-90f1-065465788784 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-02-07T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.ultramic.2010.08.001 |
| set_spec | type:ART |