Amorphous and crystallized Ge-Sb-Te thin films deposited by pulsed laser: Local structure using Raman scattering spectroscopy

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Source ISSN: 0254-0584
Author Nemec, Petr, Nazabal, Virginie, Moréac, Alain, Gutwirth, J., Beneš, L., Frumar, M.
Maintainer CCSD
Last Updated May 10, 2026, 05:02 (UTC)
Created May 10, 2026, 05:02 (UTC)
Identifier hal-00848847
Language en
contributor Department of Graphic Arts and Photophysics [University of Pardubice] ; Faculty of Chemical Technology [University of Pardubice] ; University of Pardubice-University of Pardubice
creator Nemec, Petr
date 2012-10-15T00:00:00
harvest_object_id 303379ee-ba36-4b0a-99c5-4abad0044ed2
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-07-01T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matchemphys.2012.08.024
set_spec type:ART