Statistical estimation of dominant physical parameters for leakage variability in 32nanometer CMOS under supply voltage variations
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1546-1998 |
| Author | Joshi, Smriti, Lombardot, Anne, Flatresse, Philippe, d'Agostino, Carmelo, Juge, Andre, Beigné, Edith, Girard, Stéphane |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 06:46 (UTC) |
| Created | May 10, 2026, 06:46 (UTC) |
| Identifier | hal-00846806 |
| Language | en |
| contributor | STMicroelectronics [Crolles] (ST-CROLLES) |
| creator | Joshi, Smriti |
| date | 2012-02-10T00:00:00 |
| harvest_object_id | e0610649-bf56-4ff2-b9aa-820b0eb0fbd1 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1166/jolpe.2012.1166 |
| set_spec | type:ART |