Hot topic session 4A: Reliability analysis of complex digital systems
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proc. of IEEE 31st VLSI Test Symposium (VTS'13) |
| Author | Evans, A., Nicolaidis, M., Aitken, R., Aktan, B., Lauzeral, O. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 10:08 (UTC) |
| Created | May 10, 2026, 10:08 (UTC) |
| Identifier | hal-00842825 |
| Language | en |
| contributor | iROc Technologies (IROC TECHNOLOGIES) ; Cadence Connection-EDA Consortium-FSA-Cubic Micro |
| coverage | Berkeley, United States |
| creator | Evans, A. |
| date | 2013-04-29T00:00:00 |
| harvest_object_id | 4f0f73c4-117e-494f-a646-13924e0d2516 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2013.6548898 |
| set_spec | type:COMM |