Variability-Aware and Fault-tolerant Self-Adaptive applications for Many-Core chips
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 18TH IEEE European Test Symposium (ETS), Avignon, France, May 27th - 30th |
| Author | Bizot, G., Chaix, F., Zergainoh, Nacer-Eddine, Nicolaidis, M. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 10:42 (UTC) |
| Created | May 10, 2026, 10:42 (UTC) |
| Identifier | hal-00842246 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Avignon, France |
| creator | Bizot, G. |
| date | 2013-05-27T00:00:00 |
| harvest_object_id | 1fb05b62-009f-462e-86e1-fb9618e102cd |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |