Clustering Techniques and Statistical Fault Injection for Selective Mitigation of SEUs in Flip-Flops
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | International Symposium on Quality Electronic Design (ISQED) |
| Author | Evans, A., Nicolaidis, M., Wen, S.J., Rocha de Assis, T. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 11:29 (UTC) |
| Created | May 10, 2026, 11:29 (UTC) |
| Identifier | hal-00841338 |
| Language | en |
| contributor | School of Chemical and Physical Sciences [Keele] ; Keele University [Keele] |
| coverage | Santa Clara, California, United States |
| creator | Evans, A. |
| date | 2013-03-04T00:00:00 |
| harvest_object_id | 783cd578-9621-4fd2-8845-b058d0d14ee4 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |