Made To Measure Top Hats
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 21th International Conference on Pattern Recognition (ICPR) |
| Author | Meyer, Fernand |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 17:16 (UTC) |
| Created | May 10, 2026, 17:16 (UTC) |
| Identifier | hal-00834444 |
| Language | en |
| contributor | Centre de Morphologie Mathématique (CMM) ; Mines Paris - PSL (École nationale supérieure des mines de Paris) ; Université Paris Sciences et Lettres (PSL)-Université Paris Sciences et Lettres (PSL) |
| coverage | Tsukuba, Japan |
| creator | Meyer, Fernand |
| date | 2012-11-11T00:00:00 |
| harvest_object_id | 10aca59e-7162-4dc5-aeaa-4691acbe5d49 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-01-09T00:00:00 |
| set_spec | type:COMM |