1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. Part I: Computation of the initial secondary electron emission yield

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Source ISSN: 0307-904X
Author Aoufi, Asdin, Damamme, Gilles
Maintainer CCSD
Last Updated May 10, 2026, 20:34 (UTC)
Created May 10, 2026, 20:34 (UTC)
Identifier hal-00828471
Language en
contributor Plasticité, Endommagement et Corrosion des Matériaux (PECM-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-SMS-Centre National de la Recherche Scientifique (CNRS)
creator Aoufi, Asdin
date 2010-08-15T00:00:00
harvest_object_id ca3757d2-b3fd-4294-a119-807ddc6bf976
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-02-07T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apm.2010.08.005
set_spec type:ART