Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc.
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 2158-3226 |
| Author | Carvou, Erwann, Le Garrec, Jean-Luc, Perez, J., Praquin, Jérôme, Djeddi, M., Mitchell, James, Brian Alexander |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 04:51 (UTC) |
| Created | May 11, 2026, 04:51 (UTC) |
| Identifier | hal-00821076 |
| Language | en |
| contributor | Institut de Physique de Rennes (IPR) ; Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Carvou, Erwann |
| date | 2013-03-27T00:00:00 |
| harvest_object_id | f5342193-8c78-41a8-840b-6a2e96a3e14e |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4799061 |
| set_spec | type:ART |