Effect of high current density on the admittance response of interface states in ultrathin MIS tunnel junctions.
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0038-1101 |
| Author | Godet, Christian, Fadjie-Djomkam, Alain-Bruno, Ababou-Girard, Soraya |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 09:51 (UTC) |
| Created | May 11, 2026, 09:51 (UTC) |
| Identifier | hal-00815698 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut de Physique de Rennes (IPR) ; Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Godet, Christian |
| date | 2013-02-11T00:00:00 |
| harvest_object_id | 947c900d-3f34-4170-949f-d58a10a145e3 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-05-21T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/J.SSE.2012.10.012 |
| set_spec | type:ART |