Electric-Field-Induced Resistive Switching in a Family of Mott Insulators : towards Non-Volatile Mott-RRAM Memories
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0935-9648 |
| Author | Cario, Laurent, Vaju, Cristian, Corraze, Benoît, Guiot, Vincent, Janod, Etienne |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 10:17 (UTC) |
| Created | May 11, 2026, 10:17 (UTC) |
| Identifier | hal-00815184 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut des Matériaux Jean Rouxel (IMN) ; Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST) ; Université de Nantes (UN)-Université de Nantes (UN)-Ecole Polytechnique de l'Université de Nantes (EPUN) ; Université de Nantes (UN)-Université de Nantes (UN)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Cario, Laurent |
| date | 2010-12-01T00:00:00 |
| harvest_object_id | e5cff7e9-fd24-4b2b-a36c-4acf22571c5f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-04-11T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1304.5607 |
| set_spec | type:ART |