Resistive switching induced by electronic avalanche breakdown in GaTa$_4$Se$_{8-x}$Te$_x$ narrow gap Mott Insulators
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 2041-1723 |
| Author | Guiot, Vincent, Cario, Laurent, Janod, Etienne, Corraze, Benoît, Ta Phuoc, Vinh, Rozenberg, Marcelo, Stoliar, Pablo, Cren, Tristan, Roditchev, Dimitri |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 10:19 (UTC) |
| Created | May 11, 2026, 10:19 (UTC) |
| Identifier | hal-00814337 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut des Matériaux Jean Rouxel (IMN) ; Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST) ; Université de Nantes (UN)-Université de Nantes (UN)-Ecole Polytechnique de l'Université de Nantes (EPUN) ; Université de Nantes (UN)-Université de Nantes (UN)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Guiot, Vincent |
| date | 2013-04-16T00:00:00 |
| harvest_object_id | 698d8601-c692-4c1a-a6f5-09286cd3c9b0 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-19T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1304.4749 |
| set_spec | type:ART |