A 280-GHz Schottky Diode Detector in 130-nm Digital CMOS

A 2 x 2 array of 280-GHz Schottky-barrier diode detectors with an on-chip patch antenna (255 x 250 mu m(2)) is fabricated in a 130-nm logic CMOS process. The series resistance of diode is minimized using poly-gate separation (PGS), and exhibits a cut-off frequency of 2 THz. Each detector unit can detect an incident carrier with 100-Hz similar to 2-MHz amplitude modulation. At 1-MHz modulation frequency, the estimated voltage responsivity and noise equivalent power (NEP) of the detector unit are 250 V/W and 33 pW/Hz(1/2), respectively. An integrated low-noise amplifier further boosts the responsivity to 80 kV/W. At supply voltage of 1.2 V, the entire chip consumes 1.6 mW. The array occupies 1.5 x 0.8 mm(2). A set of millimeter-wave images with a signal-noise ratio of 48 dB is formed using the detector. These suggest potential utility of Schottky diode detectors fabricated in CMOS for millimeter wave and sub-millimeter wave imaging.

Data and Resources

Additional Info

Field Value
Source ISSN: 0018-9200
Author Han, Ruonan, Zhang, Yaming, Coquillat, Dominique, Videlier, Hadley, Knap, Wojciech, Brown, Elliott, Kenneth, K. O.
Maintainer CCSD
Last Updated May 11, 2026, 11:16 (UTC)
Created May 11, 2026, 11:16 (UTC)
Identifier hal-00814188
Language en
contributor Laboratoire Charles Coulomb (L2C) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
creator Han, Ruonan
date 2011-11-11T00:00:00
harvest_object_id 008b5927-a01b-47a4-96cc-b85846efc9a7
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-02T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/JSSC.2011.2165234
set_spec type:ART