X-ray diffraction investigations of hexagonal polytypes in III-V semiconductor nanowires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | European Materials Research Society Spring Meeting, E-MRS Spring 2011, Symposium M : X-ray techniques for materials research - from laboratory sources to free electron lasers |
| Author | Kriegner, Dominik, Panse, Christian, Mandl, Bernhard, Dick, Kimberly A., Keplinger, Mario, Persson, Johan M., Caroff, Philippe, Ercolani, Daniele, Sorba, Lucia, Bechstedt, Friedhelm, Stangl, Julian, Bauer, Günther |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 17:29 (UTC) |
| Created | May 11, 2026, 17:29 (UTC) |
| Identifier | hal-00807157 |
| Language | en |
| contributor | University of Linz - Johannes Kepler Universität Linz (JKU) |
| coverage | Nice, France |
| creator | Kriegner, Dominik |
| date | 2011-05-09T00:00:00 |
| harvest_object_id | c78f779e-a038-458a-91dd-ed2705165eb7 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-10-28T00:00:00 |
| set_spec | type:COMM |