Unit cell deformations of hexagonal polytypes in III-V semiconductor nanowires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Materials Research Society Spring Meeting, MRS Spring 2011, Symposium EE : Semiconductor nanowires - From fundamentals to applications |
| Author | Kriegner, D., Panse, C., Mandl, B., Dick, K.A., Keplinger, M., Persson, J.M., Caroff, P., Ercolani, D., Sorba, L., Bechstedt, F., Stangl, J., Bauer, G. |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 17:29 (UTC) |
| Created | May 11, 2026, 17:29 (UTC) |
| Identifier | hal-00807155 |
| Language | en |
| contributor | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF) |
| coverage | San Francisco, CA, United States |
| creator | Kriegner, D. |
| date | 2011-05-11T00:00:00 |
| harvest_object_id | f018d216-4be4-49be-83da-92b181782d78 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-01-24T00:00:00 |
| set_spec | type:COMM |