A gate level methodology for efficient...
URL: https://hal.science/hal-00805478
Dataset description:
International audience
Source: A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits
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Additional Information
| Field | Value |
|---|---|
| Data last updated | unknown |
| Metadata last updated | May 12, 2026 |
| Created | unknown |
| Format | HTML |
| License | https://about.hal.science/hal-authorisation-v1/, info:eu-repo/semantics/OpenAccess |
| Created | 5 days ago |
| Id | f2cebde6-b3c6-4f48-99fd-aedb32ce0236 |
| Package id | oai-hal-hal-00805478v1 |
| Resource type | HTML |
| State | active |