Integration of temperature and current sensors in 4H-SiC VDMOS
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0255-5476 |
| Author | Berthou, Maxime, Godignon, Philippe, Brosselard, Pierre, Tournier, Dominique, Millán, José |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 05:50 (UTC) |
| Created | May 12, 2026, 05:50 (UTC) |
| Identifier | hal-00803062 |
| Language | en |
| contributor | Centro Nacional de Microelectronica [Spain] (CNM) |
| creator | Berthou, Maxime |
| date | 2012-05-12T00:00:00 |
| harvest_object_id | 7a525819-fdbf-46e6-b33e-9ae443ae4825 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-10T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.4028/www.scientific.net/MSF.717-720.1093 |
| set_spec | type:ART |