Effect of strain relaxation on the drain conductance in AlGaN/GaN HEMTs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of 1st International Conference on Engineering and Technology, ICET 2012 |
| Author | Bellakhdar, A., Telia, A., Semra, L., Soltani, A. |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 15:31 (UTC) |
| Created | May 12, 2026, 15:31 (UTC) |
| Identifier | hal-00801158 |
| Language | en |
| contributor | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF) |
| coverage | Cairo, Egypt |
| creator | Bellakhdar, A. |
| date | 2012-05-12T00:00:00 |
| harvest_object_id | ba9971ab-99ca-4c2e-94c1-fa81129b912b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-01-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ICEngTechnol.2012.6396129 |
| set_spec | type:COMM |