Fabrication and characterization of half-Kerfed LiNbO3-based high-frequency (>100MHz) ultrasonic array transducers

The effect of kerf depth is investigated on the performances of array transducers. A finite element tool, COMSOL, is employed to simulate the properties of acoustic field and to calculate the electrical properties of the arrays, including crosstalk effect and electrical impedance. Furthermore, Inductively Coupled Plasma (ICP) deep etching process is used to etch 36°/Y-cut lithium niobate (LiNbO 3 ) crystals and the limitation of etching aspect ratio is studied. Several arrays with different profiles are realized under optimized processes. At last, arrays with different pitches are fabricated and characterized by a network analyzer.

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Source IEEE International Ultrasonics Symposium, IUS 2011
Author Zhang, Jin-Ying, Xu, Wei-Jiang, Carlier, Julien, Ji, X.M., Nongaillard, Bertrand, Queste, S., Zhou, J., Huang, Y.P.
Maintainer CCSD
Last Updated May 12, 2026, 19:11 (UTC)
Created May 12, 2026, 19:11 (UTC)
Identifier hal-00800467
Language en
contributor Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
coverage Orlando, FL, United States
creator Zhang, Jin-Ying
date 2011-05-12T00:00:00
harvest_object_id 64ed4ccb-c66b-4a92-a8d4-076ede3e1459
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2024-01-24T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/ULTSYM.2011.0431
set_spec type:COMM