THz emission induced by sub-threshold instability optical excited in nanometer-length field-effect transistors
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 20th European Workshop on Heterostructure Technology, HeTech 2011 |
| Author | Nouvel, P., Torres, J., Marinchio, H., Penot, A., Palermo, C., Varani, L., Shiktorov, P., Starikov, E., Gruzinskis, V., Teppe, F., Roelens, Yannick, Shchepetov, A., Bollaert, S. |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 21:50 (UTC) |
| Created | May 12, 2026, 21:50 (UTC) |
| Identifier | hal-00799965 |
| Language | en |
| contributor | Institut d’Electronique et des Systèmes (IES) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Villeneuve d'Ascq, France |
| creator | Nouvel, P. |
| date | 2011-05-12T00:00:00 |
| harvest_object_id | 4e789ad6-9707-431c-84e8-d6d1adb26c61 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-01-24T00:00:00 |
| set_spec | type:COMM |
