THz emission induced by sub-threshold instability optical excited in nanometer-length field-effect transistors

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Source 20th European Workshop on Heterostructure Technology, HeTech 2011
Author Nouvel, P., Torres, J., Marinchio, H., Penot, A., Palermo, C., Varani, L., Shiktorov, P., Starikov, E., Gruzinskis, V., Teppe, F., Roelens, Yannick, Shchepetov, A., Bollaert, S.
Maintainer CCSD
Last Updated May 12, 2026, 21:50 (UTC)
Created May 12, 2026, 21:50 (UTC)
Identifier hal-00799965
Language en
contributor Institut d’Electronique et des Systèmes (IES) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
coverage Villeneuve d'Ascq, France
creator Nouvel, P.
date 2011-05-12T00:00:00
harvest_object_id 4e789ad6-9707-431c-84e8-d6d1adb26c61
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2024-01-24T00:00:00
set_spec type:COMM