Numerical and experimental investigation of kerf depth effect on high-frequency phased array transducer

BackgroundHigh-frequency ultrasonic transducer arrays are essential for high resolution imaging in clinical analysis and Non-Destructive Evaluation (NDE). However, the structure design and fabrication of the kerfed ultrasonic array is quite challenging when very high frequency (⩾100 MHz) is required.Objective and methodHere we investigate the effect of kerf depth on the performances of array transducers. A finite element tool, COMSOL, is employed to simulate the properties of acoustic field and to calculate the electrical properties of the arrays, including crosstalk effect and electrical impedance. Furthermore, Inductively Coupled Plasma (ICP) deep etching process is used to etch 36°/Y-cut lithium niobate (LiNbO3) crystals and the limitation of etching aspect ratio is studied. Several arrays with different profiles are realized under optimized processes. At last, arrays with a pitch of 25 μm and 40 μm are fabricated and characterized by a network analyzer.ResultsKerf depth plays an important role in the performance of the transducer array. The crosstalk is proportional to kerf depth. When kerf depth is more than 13 μm, the array with crosstalk less than −20 dB, which is acceptable for the real application, could provide a desired resolution. Compared to beam focusing, kerf depth exhibits more effect on the beam steering/focusing. The lateral pressure distribution is quantitatively summarized for four types of arrays with different kerf depth. The results of half-cut array are similar to those of the full-cut one in both cases of focusing and steering/focusing. The Full-Width-at-Half-Maximum (FWHM) is 55 μm for the half-cut array, and is 42 μm for the full-cut one. The 5-μm-cut array, suffering from severe undesired lobes, demonstrates similar behaviors with the no-cut one. ICP process is used to etch the 36°/Y-cut LiNbO3 film. The aspect ratio of etching profile increases with the kerf width decreasing till it stops by forming a V-shaped groove, and the positive tapered profile angle ranges between 62° and 80°. If the mask selectivity does not limit the process in terms of achievable depth, the aspect ratio is limited to values around 1.3. The measurement shows the electrical impedance and crosstalk are consistent with the numerical calculation.ConclusionThe numerical results indicate that half-cut array is a promising alternative for the fabrication of high-frequency ultrasonic linear arrays. In fact, the minimum pitch that could be obtained is around 25 μm, equivalent to a pitch of 1.6λ, with a kerf depth of 16 μm under the optimized ICP parameters.

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Source ISSN: 0041-624X
Author Zhang, Jin-Ying, Xu, Wei-Jiang, Carlier, Julien, Ji, X.M., Queste, S., Nongaillard, Bertrand, Huang, Y.P.
Maintainer CCSD
Last Updated May 14, 2026, 09:17 (UTC)
Created May 14, 2026, 09:17 (UTC)
Identifier hal-00790373
Language en
contributor Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
creator Zhang, Jin-Ying
date 2012-05-14T00:00:00
harvest_object_id ce811c51-cc5d-44dc-9470-37119bcb2883
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-06T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1016/j.ultras.2011.08.006
set_spec type:ART