Predicting the steady state thickness of passive films with the point defect model in fretting corrosion experiments
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of PRIME 2012 (222nd ElectroChemical Society Meeting, Pacific Rim Meeting on Electrochemical and Solid State Science) |
| Author | Géringer, Jean, Taylor, Matthew, L., Mcdonald, Digby, D. |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 05:02 (UTC) |
| Created | May 15, 2026, 05:02 (UTC) |
| Identifier | hal-00777657 |
| Language | en |
| contributor | Centre Ingénierie et Santé (CIS-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT) |
| coverage | Honolulu Hawaï, United States |
| creator | Géringer, Jean |
| date | 2012-10-07T00:00:00 |
| harvest_object_id | 2a76286f-6649-4b0d-9e04-10f0925298eb |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-23T00:00:00 |
| set_spec | type:COMM |