Variable range hopping conduction in N- and P-type in-situ doped polycrystalline silicon nanowires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0268-1242 |
| Author | Pichon, Laurent, Jacques, Emmanuel, Rogel, Régis, Salaün, Anne-Claire, Demami, Fouad |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 05:05 (UTC) |
| Created | May 15, 2026, 05:05 (UTC) |
| Identifier | hal-00777602 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut d'Electronique et de Télécommunications de Rennes (IETR) ; Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Pichon, Laurent |
| date | 2013-01-01T00:00:00 |
| harvest_object_id | c9040233-9ff5-4459-915f-6f1e427a7671 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1088/0268-1242/28/2/025002 |
| set_spec | type:ART |