In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9456 |
| Author | Sagnard, Florence, Bentabet, F., Vignat, Christophe |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 09:46 (UTC) |
| Created | May 15, 2026, 09:46 (UTC) |
| Identifier | hal-00772981 |
| Language | en |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| creator | Sagnard, Florence |
| date | 2005-06-15T00:00:00 |
| harvest_object_id | 7ae4f34f-2508-4b40-af84-50e883f4f7be |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-02T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2005.847203 |
| set_spec | type:ART |