Maintenance Testing of Mixed-Signal Boards

In the context of maintenance and diagnosis of faulty boards, we introduce a functional FSM-based model for mixed-signal circuits. We target effi cient test sequences generation for ATE based on a high-level, functional modeling of components assemblies. The approach is flexible, allows to handle digital as well as analog and mixed-signal components in a similar way. A primary prototype has been developped, and two industrial cases partially processed.

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Source 2nd IEEE Electronic System Test Workshop, ESTW05
Author Lemarchand, Laurent, Gilles, Bertrand, Nicolas, Valérie-Anne, Marce, Lionel, Castel, Bruno
Maintainer CCSD
Last Updated May 15, 2026, 13:28 (UTC)
Created May 15, 2026, 13:28 (UTC)
Identifier hal-00770475
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire d'Informatique des Systèmes Complexes (LISYC) ; École Nationale d'Ingénieurs de Brest (ENIB) ; Université de Brest (UBO EPE)-Institut National Polytechnique de Bretagne (Bretagne INP)-Université de Brest (UBO EPE)-Institut National Polytechnique de Bretagne (Bretagne INP)-Université de Brest (UBO EPE)-Institut Brestois du Numérique et des Mathématiques (IBNM) ; Université de Brest (UBO EPE)
coverage Austin, United States
creator Lemarchand, Laurent
date 2005-11-08T00:00:00
harvest_object_id a73e6f84-3db1-4169-850a-a311f4d66f5d
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-01-09T00:00:00
set_spec type:COMM