Wide field nanometric materials analysis by diffraction limited far field optical nanoscopy
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1742-6588 |
| Author | Montgomery, P.C., Montaner, D., Anstotz, F., Serio, B. |
| Maintainer | CCSD |
| Last Updated | May 28, 2026, 22:34 (UTC) |
| Created | May 28, 2026, 22:34 (UTC) |
| Identifier | hal-00769859 |
| Language | en |
| contributor | Institut d'Electronique du Solide et des Systèmes (InESS) ; Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Montgomery, P.C. |
| date | 2012-05-28T00:00:00 |
| harvest_object_id | abe0d041-5193-42d8-8812-653c8608b266 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-05-07T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1088/1742-6596/398/1/012001 |
| set_spec | type:ART |