Characterization of the pentacene thin-film transistors with an epoxy resin-based polymeric gate insulator
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1286-0042 |
| Author | Kim, C.H., Tondelier, D., Geffroy, B., Bonnassieux, Y., Horowitz, G. |
| Maintainer | CCSD |
| Last Updated | May 29, 2026, 11:17 (UTC) |
| Created | May 29, 2026, 11:17 (UTC) |
| Identifier | hal-00768705 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| creator | Kim, C.H. |
| date | 2012-02-01T00:00:00 |
| harvest_object_id | 3cd92152-613b-4ab0-9ece-e9483295e15b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2021-02-04T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1051/epjap/2011110272 |
| set_spec | type:ART |