Low temperature (down to 450° C) annealed TiAl contacts on N-type gallium nitride characterized by differential scanning calorimetry
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1862-6351 |
| Author | Thierry-Jebali, N., Menard, O., Chiriac, R., Collard, E., Brylinski, C., Cayrel, Frédéric, Alquier, D. |
| Maintainer | CCSD |
| Last Updated | May 31, 2026, 22:34 (UTC) |
| Created | May 31, 2026, 22:34 (UTC) |
| Identifier | hal-00763471 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Laboratoire des Multimatériaux et Interfaces (LMI) ; Université Claude Bernard Lyon 1 (UCBL) ; Université de Lyon-Université de Lyon-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Thierry-Jebali, N. |
| date | 2011-05-31T00:00:00 |
| harvest_object_id | 59717e81-9f8a-4ce3-89a3-a431ed81fa9a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-19T00:00:00 |
| set_spec | type:ART |