Electro-thermal high-level modeling of integrated circuits
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceeding of the 18th International Workshop on Thermal investigations of ICs and Systems (THERMINIC 2012) |
| Author | Krencker, J.C., Kammerer, J.B., Hervé, Y., Hébrard, L. |
| Maintainer | CCSD |
| Last Updated | June 3, 2026, 15:15 (UTC) |
| Created | June 3, 2026, 15:15 (UTC) |
| Identifier | hal-00758292 |
| Language | en |
| contributor | Institut d'Electronique du Solide et des Systèmes (InESS) ; Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Budapest, Hungary |
| creator | Krencker, J.C. |
| date | 2012-09-25T00:00:00 |
| harvest_object_id | 72b88ed8-c745-417b-981f-4ed2e5d4176b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-02-24T00:00:00 |
| set_spec | type:COMM |