Overlay measurements by Mueller polarimetry in back focal plane

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Source ISSN: 1932-5150
Author Fallet, Clément, Novikova, Tatiana, Foldyna, Martin, Manhas, Sandeep, Haj Ibrahim, Bicher, de Martino, Antonello, Vannuffel, Cyril, Constancias, Christophe
Maintainer CCSD
Last Updated June 4, 2026, 01:45 (UTC)
Created June 4, 2026, 01:45 (UTC)
Identifier hal-00757394
Language en
contributor Laboratoire de Physique des Interfaces et des Couches Minces (LPICM) ; École polytechnique (X) ; Institut Polytechnique de Paris (IP Paris)-Institut Polytechnique de Paris (IP Paris)-Centre National de la Recherche Scientifique (CNRS)
creator Fallet, Clément
date 2011-09-04T00:00:00
harvest_object_id b3325456-5706-47a0-b087-00513e219e65
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-21T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1117/1.3626852
set_spec type:ART