Generalized ellipsometry of artificially designed line width roughness

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Source ISSN: 0040-6090
Author Foldyna, Martin, Germer, Thomas A., Bergner, Brent C., Dixson, Ronald G.
Maintainer CCSD
Last Updated June 4, 2026, 01:20 (UTC)
Created June 4, 2026, 01:20 (UTC)
Identifier hal-00757371
Language en
contributor Laboratoire de Physique des Interfaces et des Couches Minces (LPICM) ; École polytechnique (X) ; Institut Polytechnique de Paris (IP Paris)-Institut Polytechnique de Paris (IP Paris)-Centre National de la Recherche Scientifique (CNRS)
creator Foldyna, Martin
date 2011-02-04T00:00:00
harvest_object_id fe609f72-5d71-4469-a6d1-16dd6e5b3e6b
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-11-21T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1016/J.TSF.2010.11.085
set_spec type:ART