Integration of temperature and current sensors in 4H-SiC VDMOS
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of the 14th International Conference on Silicon Carbide and Related Materials |
| Author | Berthou, Maxime, Godignon, Philippe, Brosselard, Pierre, Tournier, Dominique, Millán, José |
| Maintainer | CCSD |
| Last Updated | October 30, 2026, 05:02 (UTC) |
| Created | October 30, 2026, 05:02 (UTC) |
| Identifier | hal-00747607 |
| Language | en |
| contributor | Centro Nacional de Microelectronica [Spain] (CNM) |
| coverage | Cleveland, United States |
| creator | Berthou, Maxime |
| date | 2011-09-11T00:00:00 |
| harvest_object_id | 1109ef86-5873-4473-930f-ff48dea70017 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-10-02T00:00:00 |
| set_spec | type:COMM |