Focal Point Review - Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0003-7028 |
| Author | Garcia-Caurel, Enric, de Martino, Antonello, Gaston, Jean-Paul, Yan, Li |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 11:04 (UTC) |
| Created | May 15, 2026, 11:04 (UTC) |
| Identifier | hal-00738027 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Laboratoire de Physique des Interfaces et des Couches Minces (LPICM) ; École polytechnique (X) ; Institut Polytechnique de Paris (IP Paris)-Institut Polytechnique de Paris (IP Paris)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Garcia-Caurel, Enric |
| date | 2013-01-03T00:00:00 |
| harvest_object_id | 62a6c2fe-8fb7-446f-aa0d-0dc73fcef230 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-11-21T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1210.1076 |
| set_spec | type:ART |