Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0040-6090 |
| Author | Jagtap, Vishal, Dégardin, Annick, Kreisler, Alain |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 14:30 (UTC) |
| Created | May 15, 2026, 14:30 (UTC) |
| Identifier | hal-00710686 |
| Language | en |
| contributor | Laboratoire de génie électrique de Paris (LGEP) ; Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Jagtap, Vishal |
| date | 2012-05-15T00:00:00 |
| harvest_object_id | f3784bed-364a-49fe-8da8-db4c4b639070 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-10-20T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.tsf.2011.10.127 |
| set_spec | type:ART |