Excitonic effects in GaN stacking faults and crystal phase quantum wells
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | International Conference on the Physics of Semiconductors |
| Author | Corfdir, Pierre, Lefebvre, Pierre |
| Maintainer | CCSD |
| Last Updated | May 15, 2026, 17:29 (UTC) |
| Created | May 15, 2026, 17:29 (UTC) |
| Identifier | hal-00708666 |
| Language | en |
| contributor | Cavendish Laboratory ; University of Cambridge [Cambridge, UK] (CAM) |
| coverage | Zürich, Switzerland |
| creator | Corfdir, Pierre |
| date | 2012-07-29T00:00:00 |
| harvest_object_id | cb875056-2418-4cf9-9ebc-8e2b03202b58 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-12-29T00:00:00 |
| set_spec | type:POSTER |