Design for Test and Reliability in Ultimate CMOS
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proc. of Design, Automation and Test in Europe (DATE'12) |
| Author | Nicolaidis, M., Anghel, Lorena, Zergainoh, Nacer-Eddine, Zorian, Y., Karnik, T., Bowman, K., Tschanz, J., Lu, S.-L., Tokunaga, C., Raychowdhury, A., Khellah, M., Kulkarini, J., Vivek, De, Avresky, D. |
| Maintainer | CCSD |
| Last Updated | May 21, 2026, 18:49 (UTC) |
| Created | May 21, 2026, 18:49 (UTC) |
| Identifier | hal-00688282 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Dresden, Germany |
| creator | Nicolaidis, M. |
| date | 2012-03-12T00:00:00 |
| harvest_object_id | 710e81a9-bca5-4253-8a05-567f636214df |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COMM |