Dependability of complex semiconductor systems : Learning Bayesian Networks for decision support

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Source Third International Workshop on Dependable Control of Discrete Systems (DCDS 2011)
Author Bouaziz, Mohammed Farouk, Zamaï, Éric, Duvivier, F., Hubac, S.
Maintainer CCSD
Last Updated May 23, 2026, 09:21 (UTC)
Created May 23, 2026, 09:21 (UTC)
Identifier hal-00683047
Language en
contributor Gestion et Conduite des Systèmes de Production (G-SCOP_GCSP) ; Laboratoire des sciences pour la conception, l'optimisation et la production (G-SCOP) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
coverage Saarbüken, Germany
creator Bouaziz, Mohammed Farouk
date 2011-06-15T00:00:00
harvest_object_id 3b24f0ab-2e0d-4ba7-88fe-ff70c5c57614
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-09-27T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/DCDS.2011.5970310
set_spec type:COMM