An extended LLRP model for RFID system test and diagnosis

International audience

Data and Resources

Additional Info

Field Value
Source The 8th Workshop on Advances in Model Based Testing
Author Kheddam, Rafik, Aktouf, Oum-El-Kheir, Parissis, Ioannis
Maintainer CCSD
Last Updated May 25, 2026, 17:50 (UTC)
Created May 25, 2026, 17:50 (UTC)
Identifier hal-00676582
Language en
contributor Laboratoire de Conception et d'Intégration des Systèmes (LCIS) ; Université Pierre Mendès France - Grenoble 2 (UPMF)-Institut National Polytechnique de Grenoble (INPG)
coverage Quebec, Canada
creator Kheddam, Rafik
date 2012-04-17T00:00:00
harvest_object_id 2b9ebd26-3585-469d-bb11-e4faaebfae3d
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-09-27T00:00:00
set_spec type:COMM