A new fault injection approach to study the impact of bitflips in the configuration of SRAM-based FPGAs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1683-3198 |
| Author | Ziade, H., Ayoubi, R., Velazco, Raoul |
| Maintainer | CCSD |
| Last Updated | May 27, 2026, 18:07 (UTC) |
| Created | May 27, 2026, 18:07 (UTC) |
| Identifier | hal-00672465 |
| Language | en |
| contributor | Faculty of Engineering I (FACULTY OF ENGINEERING I) ; الجامعة اللبنانية [بيروت] = Lebanese University [Beirut] = Université libanaise [Beyrouth] (LU / ULB) |
| creator | Ziade, H. |
| date | 2011-05-27T00:00:00 |
| harvest_object_id | be04759d-bb81-4923-a1a3-53678638ea4a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:ART |