Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0923-8174 |
| Author | Foucard, G., Peronnard, P., Velazco, Raoul |
| Maintainer | CCSD |
| Last Updated | May 27, 2026, 18:44 (UTC) |
| Created | May 27, 2026, 18:44 (UTC) |
| Identifier | hal-00672434 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Foucard, G. |
| date | 2011-05-27T00:00:00 |
| harvest_object_id | b2a24c59-1fe5-4a44-bd26-f3f8ca702324 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1007/s10836-011-5245-4 |
| set_spec | type:ART |